کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1772489 1021047 2013 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
High-resolution 22-52 keV backlighter sources and application to X-ray radiography
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم نجوم و فیزیک نجومی
پیش نمایش صفحه اول مقاله
High-resolution 22-52 keV backlighter sources and application to X-ray radiography
چکیده انگلیسی
The requirement for sources of hard X-rays suitable for high resolution radiography through large ρR targets is prominent in many aspects of current laser-driven plasma physics research. In recent work using the OMEGA EP laser facility [L. J. Waxer, M. J. Guardalben, J. H. Kelly et al., CLEO/QELS, Optical Society of America, San Jose, CA, IEEE (2008)] at the Laboratory for Laser Energetics (LLE) in Rochester, NY, experiments have been performed to measure characteristics of 22-52 keV X-ray sources using high intensity short-pulse lasers. High quality point projection, two-dimensional radiography was demonstrated by irradiating microwire targets with laser intensities of 1016 W cm−2-1019 W cm−2. Microwire targets were manufactured to dimensions of 10 μm × 10 μm × 300 μm and were supported by a 100 μm × 300 μm × 6 μm low-Z substrate. Measurements of the k-α conversion efficiency and X-ray source-size are discussed and, of particular importance for radiography, the spectral purity of the backlighter is characterized to assess the relative importance of the Kα emission to bremsstrahlung background.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: High Energy Density Physics - Volume 9, Issue 3, September 2013, Pages 635-641
نویسندگان
, , , , , , , , , ,