Influences of thick film inhomogeneities on the ellipsometric parameters

Infrared spectroscopic ellipsometry performed at the synchrotron infrared beamline at BESSY II facility was compared with measurements carried out using a conventional globar source. Lateral inhomogeneities of a thick free-standing low-density polyethylene (LDPE) film, and their influences on the ellipsometric parameters tan ψ, Δ and the degree of phase polarization were studied. Simulations based on coherent, partially incoherent and incoherent radiation propagation in a thick film are presented along with the measured data.