کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1798413 | 1524821 | 2016 | 5 صفحه PDF | دانلود رایگان |
• AFM tips with a magnetic bead attached used to test interaction with domain wall.
• Domain wall inside a nanostructure affect the electrical resistance.
• Recording electrical resistance while scanning with modified AFM probe.
• Change of resistance as a function of the position of the magnetic bead.
• This allows comparing different devices in a reproducible and controllable way.
We apply the magnetic scanning gate microscopy (SGM) technique to study the interaction between a magnetic bead (MB) and a domain wall (DW) trapped in an L-shaped magnetic nanostructure. Magnetic SGM is performed using a custom-made probe, comprising a hard magnetic NdFeB bead of diameter 1.6 µm attached to a standard silicon tip. The MB–DW interaction is detected by measuring changes in the electrical resistance of the device as a function of the tip position. By scanning at different heights, we create a 3D map of the MB–DW interaction and extract the sensing volume for different widths of the nanostructure's arms. It is shown that for 50 nm wide devices the sensing volume is a cone of 880 nm in diameter by 1.4 µm in height, and reduces down to 800 nm in height for 100 nm devices with almost no change in its diameter.
Journal: Journal of Magnetism and Magnetic Materials - Volume 400, 15 February 2016, Pages 225–229