Magnetic and structural properties of Co2FeAl thin films grown on Si substrate

• Various Co2FeAl thin films were grown on a Si(001) substrates and annealed at 600 °C.
• The thickness dependence of magnetic and structural properties has been studied.
• X-ray measurements revealed an (011) out-of-plane textured growth of the films.
• The easy axis coercive field varies linearly with the inverse CFA thickness.
• The effective magnetization increases linearly with the inverse film thickness.

The correlation between magnetic and structural properties of Co2FeAl (CFA) thin films of different thicknesses (10 nm