کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1801215 | 1024563 | 2010 | 12 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Direct and inverse measurement of thin films magnetostriction
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Direct and inverse measurement of thin films magnetostriction Direct and inverse measurement of thin films magnetostriction](/preview/png/1801215.png)
چکیده انگلیسی
Two techniques of measurements of thin film magnetostriction are compared: direct, when changes of the substrate curvature caused by the film magnetization are controlled, and inverse (“indirect”), when the modification of the magnetic anisotropy induced by the substrate deformation (usually bending) is measured. We demonstrate how both the elastic strength of the substrate and the effective magneto-mechanical coupling between the substrate deformation and magnetic anisotropy of the film depend on different conditions of bending. Equations to be used for magnetostriction value determination in typical cases are given and critical parameters for the corresponding approximations are identified.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Magnetism and Magnetic Materials - Volume 322, Issue 15, August 2010, Pages 2203–2214
Journal: Journal of Magnetism and Magnetic Materials - Volume 322, Issue 15, August 2010, Pages 2203–2214
نویسندگان
J.-Ph. Jay, F. Le Berre, S.P. Pogossian, M.V. Indenbom,