کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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1802952 | 1024608 | 2009 | 4 صفحه PDF | دانلود رایگان |
We present an experimental investigation of the magnetization reversal process in NiFe/Cu(10 nm)/Co circular and elliptical nano-elements with different thickness of the magnetic layers. The results obtained using element sensitive X-ray resonant magnetic scattering (XRMS) were compared with the previous measurements showing that the dipolar interlayer coupling favours the antiparallel alignment of the two magnetization layers at remanance. In the case of circular shape, the increased thickness of the ferromagnetic layers stabilizes the antiparallel alignment of the layers over a wider field range. A similar effect, accompanied by a delay in the onset of the antiparallel alignment, is observed in the case of elliptical nano-elements and applying the external field along the longer axis of the elements, due to the additional shape anisotropy.
Journal: Journal of Magnetism and Magnetic Materials - Volume 321, Issue 19, October 2009, Pages 3038–3041