کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1803245 | 1024613 | 2009 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electron scattering characteristics of polycrystalline metal transition films by in-situ electrical resistance measurements
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
In-situ electrical resistance measurements were performed to obtain the scattering characteristics of very thin polycrystalline metal transition magnetic alloys grown by ion beam deposition (IBD) on specific underlayers. The experimental curves show size effects at small film thicknesses and important differences between Co85Fe15 and Ni81Fe19 thin layers grown on identical underlayers of Ta70Â Ã
/Ru13Â Ã
. The largest difference was observed in Ni81Fe19 films grown on underlayers of amorphous Ta70Â Ã
. The experimental curves of electrical resistivity/conductivity variation with layer thickness were well fit within the Mayadas and Shatzkes (M-S) model, assuming specific formulations for grain growth with layer thickness.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Magnetism and Magnetic Materials - Volume 321, Issue 16, August 2009, Pages 2494-2498
Journal: Journal of Magnetism and Magnetic Materials - Volume 321, Issue 16, August 2009, Pages 2494-2498
نویسندگان
I.G. Trindade, D. Leitão, R. Fermento, Y. Pogorelev, J.B. Sousa,