کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1803347 | 1024616 | 2006 | 5 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Soft X-ray resonant magnetic scattering studies on Fe/CoO exchange bias system Soft X-ray resonant magnetic scattering studies on Fe/CoO exchange bias system](/preview/png/1803347.png)
We have used soft X-ray resonant magnetic scattering (XRMS) to search for the presence of an effective ferromagnetic moment belonging to the antiferromagnetic (AF) layer which is in close contact with a ferromagnetic (F) layer. Taking advantage of the element specificity of the XRMS technique, we have measured hysteresis loops of both Fe and CoO layers of a CoO(40 Å)/Fe (150 Å) exchange bias bilayer. From these measurements we have concluded that the proximity of the F layer induces a magnetic moment in the AF layer. The F moment of the AF layer has two components: one is frozen and does not follow the applied magnetic field and the other one follows in phase the ferromagnetic magnetization of the F layer. The temperature dependence of the F components belonging to the AF layer is shown and discussed.
Journal: Journal of Magnetism and Magnetic Materials - Volume 300, Issue 1, May 2006, Pages 206–210