Micromagnetic modeling studies on the effects of stress on magnetization reversal and dynamic hysteresis

The complex behaviors of magnetic materials subjected to magneto-electro-mechanical coupled fields call for a better understanding of the mechanism of multi-fields coupling. In this paper, micromagnetic modeling is carried out to study the effect of stress on hysteresis loops and dynamic magnetization reversal. The time-dependent Landau–Lifshitz–Gilbert equation which governs the evolution of magnetization is solved using the fast Fourier transform technique in reciprocal space. The simulation results show that the stress changes the distribution of easy directions and, therefore, leads to the change of magnetic properties. Moreover, the positive product of the stress and saturation magnetostriction coefficients increases the coercivity, hence, increases the area enclosed by the hysteresis loop. A stress-induced magnetization reversal is investigated.