کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
180611 459384 2011 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
High-aspect ratio needle probes for combined scanning electrochemical microscopy — Atomic force microscopy
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی شیمی مهندسی شیمی (عمومی)
پیش نمایش صفحه اول مقاله
High-aspect ratio needle probes for combined scanning electrochemical microscopy — Atomic force microscopy
چکیده انگلیسی

The development and characterisation of high-aspect ratio needle probes for combined scanning electrochemical microscopy–atomic force microscopy (SECM–AFM) is described. Commercially available coated metallic needle probes have been modified by a simple procedure to yield probes with an addressable nano-disk electrode integrated into the tip apex. The probes behaved well electrochemically, with a typical electrochemical radius of approximately 140 nm and the preliminary application of these probes to high-resolution topographical and electrochemical imaging was demonstrated.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Electrochemistry Communications - Volume 13, Issue 1, January 2011, Pages 78–81
نویسندگان
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