Alternating current (AC) impedance imaging with combined atomic force scanning electrochemical microscopy (AFM-SECM)

AFM-SECM measurements using alternating current mode SECM (AC–SECM) were performed at an AFM tip with an integrated recessed ring microelectrode. Measurements were carried out in a three-electrode arrangement at 14.92 kHz and 110 mVpp in 1 mM KCl solution. Combined AFM–AC–SECM enables the detection of electrochemical surface properties with high lateral resolution without addition of a redox mediator, thereby providing images on topographical changes along with chemical information. For demonstrating the capabilities of this method, simultaneously recorded data on the topography and the surface conductivity of gold/glass structures and of microelectrode arrays are discussed.