Novel strategy for constant-distance imaging using alternating current scanning electrochemical microscopy

Scanning electrochemical microscopy (SECM) still lacks reliable means for performing constant-distance imaging experiments. We demonstrate, for the first time, that the same negative alternating current (AC) feedback can be observed on approach to an insulator and an unbiased conductor at optimal experimental conditions. This leads to a novel constant-distance imaging mode. To perform AC-SECM imaging, only minor modifications of the existing SECM set-up were necessary. The new constant-distance AC-SECM imaging was conducted to provide topographical information not affected by variations in sample conductivity and reactivity. Furthermore, simultaneous AC and DC SECM measurements were carried out to demonstrate that both topographical and chemical information could be revealed.