Recording Density, Contact Induced Stress and Local Deformation of Bit Patterned Media

Bit-patterned media are being considered as a promising approach for achieving multi-terabit per inch recording densities. The effects of different recording density of bit-patterned media of mechanical surface loading on deformation of elastic-plastic multi-layers are analyzed by using the finite element method. The thermal protrusion of a thermal flying height control (TFC) slider and the wave surface of an elastic-plastic thin film are chosen to perform a contact analysis at the head-disk interface (HDI). A two dimensional finite element model between head and patterned media is then developed. Two patterned media cases are investigated and presented in this paper. The evolution of deformation in multi-layer media due to mechanical surface loading is presented by maximum von Mises stress and contact pressure.