Effect of carrier injection process in the organic field-effect transistor by introducing metal nanoparticle monolayer

Silver nanoparticles (NPs) self-assembled monolayer (SAM) was deposited on pentacene organic field-effect transistors (OFET) via modified Langmuir-Schaffer (horizontal lifting) technique and its effect was being investigated by steady-state method which is current-voltage measurements. Here we focus on its effect to the carrier injection. The contact resistance, drain-source current, trapped charges and threshold voltage analysis revealed that OFET with SAM exhibited significant charge trapping effect due to the space charge field formed by immobile/ trapped charges and further influenced the carrier injection.