Numerical Investigation on Accuracy of Defect Detection in HTS Film by Inductive Method

The inductive method for measuring the critical current density in a high-temperature superconducting (HTS) film has been reproduced numerically. To this end, a numerical code has been developed for analyzing the time evolution of a shielding current density in the HTS film containing a crack. The results of computations show that the accuracy of the inductive method is degraded due to the crack or the film edge. This result means that the inductive method can be applied to the crack detection. However, the crack located near the film edge cannot be detected because the crack is treated the same as the film edge.