Annealing of Thin Metallic Films Studied by Depth Dependent DB-Spectroscopy and Free Ps Annihilation

Recent results from depth dependent (C)DB measurements on thin metallic films using the high intense monoener-getic positron beam NEPOMUC are presented. Vapor-deposited films of gold and copper were characterized by depth dependent DB-spectroscopy. The positron diffusion length in thin films was determined by the Doppler broadening of the annihilation radiation and additionally the formation of positronium (Ps) at the surface. Furthermore, the depth dependent DB-and CDB-measurements were compared. During high temperature measurements, the annealing of a thin gold film was observed.