The problem of dating quartz 2: Synchrotron generated X-ray excited optical luminescence (XEOL) from quartz

The luminescence emission of quartz is used in optically stimulated luminescence dating (OSL), however the precise origins of the emission are unclear. A suite of quartz samples were analysed using X-ray excited optical luminescence (XEOL). Radiation dose effects were observed whereby the UV emissions (3.8 and 3.4 eV) were depleted to the benefit of the red emission (1.9–2.0 eV). Samples were excited at ∼7 keV. Understanding why some quartz emit light more brightly than others will increase the efficiency and precision of OSL analyses.

► The X-ray excited optical luminescence (XEOL) emission of quartz is explored.
► The XEOL of quartz of different provenances varies.
► Radiation dosing causes UV emissions to deplete to the benefit of red emissions.
► The 3.8 and 3.4 eV emissions deplete at the same rate.
► The quartz luminescence emission exhibits anisotropic effects.