Variability characteristics of the HTTL to dosimetry peaks ratio in LiF:Mg,Ti

The variability of the HTTL to dosimetry peaks ratio was investigated by performing statistical checks with TLD crystals (LiF:Mg,Ti) from four different batches, from two producers and with different irradiation histories. As the main purpose was to check applicability to routine practice, TLD cards were used (commercial PTFE coated crystals) and a high heating rate of 25 °C s−1 was applied to a maximal temperature of 300 °C. The standard deviations of the ratio average for the same chip and averaged over the batches and over all readouts were close and less than about 6%, indicating stable and constant values. Only a few anomalous values were observed, caused by faulty chips or irregular readouts.