کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1885048 | 1533438 | 2013 | 5 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Chemical cross sections induced by ions in solid organic detectors: Experimentation and simulation Chemical cross sections induced by ions in solid organic detectors: Experimentation and simulation](/preview/png/1885048.png)
Chemical ester bond scission induced by incoming ions in polyethylene terephthalate (PET), bisphenol A polycarbonate (PC), polyallyl diglycol carbonate (PADC), have been systematically determined by FT-IR transmission measurements. The studied ions (H, He, C, Ne, I, Ar, Fe, Kr, Xe) have LET ranging from 10 to 10 000 keV μm−1. We discuss the opportunity to simulate the experimental chemical cross section obtained with an approach based on the dose deposited by the secondary electrons removed by the incoming ion. Such an approach has been already successfully applied for LR115.
► Damages induced by ions in 3 polymers have been systematically determined by FT-IR.
► Chemical cross sections were simulated with the dose deposited by secondary electrons.
► Very good agreements are observed between experimental and simulated data.
Journal: Radiation Measurements - Volume 50, March 2013, Pages 38–42