کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1885080 | 1533438 | 2013 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Evolution of etched nuclear track profiles of alpha particles in CR-39 by atomic force microscopy
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
تشعشع
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
A series of atomic force microscopy (AFM) images of etched nuclear tracks has been obtained and used to calculate the nuclear track registration sensitivity parameter V(x) = Vt(x)/Vb. Due to the AFM limitations the samples were irradiated normally to the surface, and with energies attenuated in order to include the Bragg peak region in the AFM piezo-scanner z movement range. The simulation of the track profile evolution was then obtained. The different stages of etched nuclear track profiles were rendered.
► Using AFM we reach that Bragg peak region of etched tracks in CR-39.
► The etched track sensitivity V was calculated by data obtained by AFM.
► The evolucion of etched nuclear tracks was simulated by data achieved by AFM.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Radiation Measurements - Volume 50, March 2013, Pages 197–200
Journal: Radiation Measurements - Volume 50, March 2013, Pages 197–200
نویسندگان
R. Félix-Bautista, C. Hernández-Hernández, B.E. Zendejas-Leal, R. Fragoso, J.I. Golzarri, C. Vázquez-López, G. Espinosa,