Effects of UVC irradiation on alpha-particle track parameters in CR-39

The effects of UVC exposure on the track etch rate VtVt and the detector sensitivity VV of CR-39 SSNTDs were investigated through the diameters and depths of alpha-particle tracks. Both the bulk etch rate VbVb and VtVt increased but VV decreased. The track diameters and depths were used to derive a VV function for CR-39 detectors with and without UV irradiation.