کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1888057 | 1533400 | 2016 | 5 صفحه PDF | دانلود رایگان |

• TLD 500 chips yield TL sensitivity changes after long-term use without change in the TL glow curve shape.
• Sensitivity changes could be attributed to the occupancy of VDT.
• After TA-OSL, the maximum sensitization monitored after 5 cycles of dosing and measurements is decreased.
• TA-OSL signal of TLD 500 dosimeters yields negligible sensitization.
• TA-OSL is highly suggested for the case of TLD 500 chips after long-term use.
Thermally assisted optically stimulated luminescence (TA-OSL) method is an excellent advancement of high-dose luminescent dosimetry with involvement of very deep traps. This specific method has been reported to be very efficient for the cases of anion deficient alumina doped with carbon and quartz. Nevertheless, reproducibility and sensitivity changes have been previously studied only for the case of quartz. In the present study, reproducibility was studied in both terms of quantitative and qualitative features, such as signal intensity and glow curve shape respectively, for both TL and TA-OSL signals on various TLD 500 dosimeters. Finally, for the case of the TL signal, sensitivity changes were studied with and without applying TA-OSL, towards studying the impact of the TA-OSL on the main dosimetric TL signal.
Journal: Radiation Measurements - Volume 90, July 2016, Pages 269–273