کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1888578 | 1043714 | 2012 | 6 صفحه PDF | دانلود رایگان |

In this work, new empirical equation describing the charged particles radiation track development against etching time and track longitudinal depth are presented. The equation involves four free fitting parameters. It is shown that this equation can reproduce tracks depth formed on the CR-39 by alpha particles at different energies and etching times. Parameters values obtained from experimental data can be used to predict etched track lengths at different energies and etching times. The empirical equation suggested is self consistent as far as reproducing all features of track depth development as a function of etching time and energy are concerned.
► New empirical model for alpha particles tracks depth in CR-39 SSNTD is presented.
► The model uses four energy independent parameters.
► Mathematical form of track etching rate is derived.
► The model results are compared with experimental data.
Journal: Radiation Measurements - Volume 47, Issue 1, January 2012, Pages 67–72