کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1889186 | 1533450 | 2007 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Correlation of the dielectric properties and the PSL-sensitivity in CsBr:Eu image plates
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
تشعشع
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چکیده انگلیسی
The X-ray storage phosphor CsBr:Eu is in the focus of research because of its very high sensitivity of the photostimulated luminescence (PSL). In this contribution, we demonstrate a correlation of the dielectric properties of this material with the PSL-efficiency. The high experimental dielectric constant of the image plate correlates with the high sensitivity of the storage phosphor what has been shown for both thermal annealing and high doses X-ray irradiation. It is our hypothesis that correlation between the dielectric material properties and PSL is due to a stable polarization or, more generally, electric dipoles in the material that improve either the separation of electrons and holes during their generation or their trapping.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Radiation Measurements - Volume 42, Issues 4–5, April–May 2007, Pages 657–660
Journal: Radiation Measurements - Volume 42, Issues 4–5, April–May 2007, Pages 657–660
نویسندگان
G. Schierning, M. Batentschuk, A. Osvet, A. Winnacker, L. Stuye, J.-P. Tahon, P. Leblans,