کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
295219 511532 2012 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The influence of sharp edges in corrosion profiles on the reflection of guided waves
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی عمران و سازه
پیش نمایش صفحه اول مقاله
The influence of sharp edges in corrosion profiles on the reflection of guided waves
چکیده انگلیسی

The capacity of guided ultrasonic waves to size real corrosion defects remains challenging due to the complexity of the profiles encountered in practice, defects with large sudden changes in depth over a small circumferential region being particularly problematic. The objective of this paper is to diagnose whether the defect profile changes sharply by studying the frequency dependence of the reflection from the defect by separating the low and high spatial frequency components of defect profiles and analyzing their effect on the reflection coefficient (RC) spectrum. It has been found that the low pass spatial frequencies give significant reflection only at low frequencies; similarly, high spatial frequencies result in significant reflection only at high frequencies. For a defect with a sharp change in depth within a small region otherwise surrounded by general corrosion, the reflection from the high spatial frequencies contributes significantly to the maximum peak of the RC. In contrast, in the case of a more gradual corrosion patch, its high spatial frequencies make only a very modest contribution to the maximum peak RC. Also, the RC calculated by superposition of the low and high spatial frequency content of a defect gives a good approximation to the RC from the full profile. A method to diagnose the presence of sharp edges in corrosion patches based on the analysis of the RC spectrum is proposed, and the limitations of the procedure are defined. The main FE results are validated experimentally.


► Reflection from low and high spatial frequency components of defect are analyzed.
► Low spatial frequencies give significant reflection only at low frequencies.
► High spatial frequencies result in significant reflection only at high frequencies.
► Diagnosis of presence of sharp changes in defect profiles possible from RC spectrum.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: NDT & E International - Volume 52, November 2012, Pages 57–68
نویسندگان
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