Determination of the accuracy of phase analysis measurements on spherical surfaces through X-ray diffraction

This research analyzes the effect on measurement accuracy when taking X-ray diffraction (XRD) measurements on spherical rather than flat surfaces in the assessment of the proportion of retained austenite and martensite phases. By calculating the difference in X-ray absorption paths between a flat surface and spherical surface, this study demonstrates that only in spherical surfaces of small diameter (⩽0.381 cm) will the difference in X-ray absorption path affect the accuracy of measurements derived from XRD. To improve the accuracy of such measurements, the research presents a model for quantifying the absorption path that X-rays follow when measuring spherical surfaces.