Structured light system-based selective data acquisition

Selective data acquisition has been introduced recently for direct interfacing reverse engineering (RE) with rapid prototyping (RP). Data are acquired selectively and locally layer by layer according to the analysis of an image processing algorithm that has been developed for recommending the scanning positions from the edge images of the object. The recommendations, however, depend on the quality of the input images and the edge detection parameters. An attempt to make selective data acquisition more robust and less sensitive to the aforementioned factors is therefore presented in this paper. A structured light system (SLS) and projective transformation have been integrated into this SLS-based selective data acquisition to induce features on an object surface to appear explicitly through phase distortion of a projected bright line, and to diminish perspective distortion effects in the analysis through transformation of deformed bright lines on side views to be contour segments on top view. The implementation of this new selective data acquisition approach is also presented and discussed.