Analysis of microstrip discontinuities by FDTD method combined with SOC technique

In this paper, the application of the finite-difference time-domain (FDTD) algorithm combined with the short-open calibration SOC technique to three-dimensional microstrip discontinuity is presented. This SOC technique is directly accommodated in the FDTD algorithm. It is used to remove the unwanted parasitic errors brought by the approximation of the impressed voltage sources and the feed lines. The FDTD is formulated in such a way that the port voltages and currents are explicitly represented through relevant network matrices. This new method is also used to analyze finite periodic structures. The scattering parameters of the whole periodic structure can be approximately obtained through analyzing only one cell of it. The results for microstrip discontinuities and finite periodic structures are compared with the conventional FDTD method.