Full-field optical coherence microscopy with a sub-nanosecond supercontinuum light source for material research

Full-field optical coherence microscopy performed with a supercontinuum light source based on a Q-switched micro-chip laser pumped photonic crystal fiber is shown to provide ultra-high resolution images from the interior of scattering samples. We exemplify our imaging approach by a detailed analysis of fiber reinforced polymer samples: comparative analysis by X-ray computed tomography as well as advanced data processing of the obtained 3D data is used to retrieve information on physical parameters like fiber orientation and distribution of point defect structures.

► Novel application of sub-ns SC sources in full-field optical coherence microscopy (FF-OCM).
► Demonstration of successful use of sub-ns SC sources in FF-OCM for micro-material testing.
► Ultra high resolution imaging and cost efficiency.
► Benefits by complementary information content between FF-OCM and μ-XCT.
► Advanced image processing.