کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
4911757 | 1428531 | 2017 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Effects of dispersion methods and surface treatment of carbon nano-tubes on defect detectability and static strengths of adhesive joints
ترجمه فارسی عنوان
تأثیر روش های پراکندگی و درمان سطح نانو لوله های کربن بر شناسایی نقص و استحکام اتصالات چسب
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کلمات کلیدی
نانولوله های کربنی، روش امپدانس، چسب مشترک، تک لبه مفصل، تشخیص نقص،
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی عمران و سازه
چکیده انگلیسی
Adhesive bonding and bolting are two typical joining methods of composites. Adhesive bonding does not require holes, and the load is distributed over a larger area than that in mechanical joints. However, such bonding is highly sensitive to the surface treatment, service temperature, humidity, and other environmental conditions. In particular, the formation of kissing bonds (due to surface defects or contamination) reduces the bonding strength significantly. The electrical-impedance method using carbon nano-tubes (CNTs) is a highly promising technology that helps in detecting different types of bonding defects. In this study, aluminum-to-aluminum adhesive joints with 1Â wt% CNTs were fabricated. The static strengths and defect detectabilities determined using the electrical-impedance method were then evaluated. To uniformly disperse the CNTs into the adhesive, a sonication process, a three-roll-mill process, and solvent were employed. The defect detectabilities and static strengths of the adhesive joints produced using five different types of dispersion methods were then evaluated. Moreover, the defect detectability and static strength of the adhesive joints with respect to the surface treatment of the CNTs were investigated.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Composite Structures - Volume 176, 15 September 2017, Pages 684-691
Journal: Composite Structures - Volume 176, 15 September 2017, Pages 684-691
نویسندگان
Cheol-Hwan Kim, Jin-Ho Choi,