کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
4969938 1449988 2016 43 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Face recognition using linear representation ensembles
ترجمه فارسی عنوان
تشخیص چهره با استفاده از نمادهای خطی
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر چشم انداز کامپیوتر و تشخیص الگو
چکیده انگلیسی
In the past decade, linear representation based face recognition has become a very popular research subject in computer vision. This method assumes that faces belonging to one individual reside in a low-dimensional linear subspace. In real-world applications, however, face images usually are of degraded quality due to expression variations, disguises, and partial occlusions. These problems undermine the validity of the subspace assumption and thus the recognition performance deteriorates significantly. In this work, we propose a simple yet effective framework to address the problem. Observing that the linear subspace assumption is more reliable on certain face patches rather than on the holistic face, Probabilistic Patch Representations (PPRs) are randomly generated, according to the Bayesian theory. We then train an ensemble model over the patch-representations by minimizing the empirical risk w.r.t. the “leave-one-out margins”, which we term Linear Representation Ensemble (LRE). In the test stage, to handle the non-facial or novel face patterns, we design a simple inference method to dynamically tune the ensemble weights according to the proposed Generic Face Confidence (GFC). Furthermore, to accommodate immense PPR sets, a boosting-like algorithm is also derived. In addition, we theoretically prove two desirable property of the proposed learning methods. We extensively evaluate the proposed methods on four public face dataset, i.e., Yale-B, AR, FRGC and LFW, and the results demonstrate the superiority of both our two methods over many other state-of-the art algorithms, in terms of both recognition accuracy and computational efficiency.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Pattern Recognition - Volume 59, November 2016, Pages 72-87
نویسندگان
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