کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
499083 | 863026 | 2009 | 15 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
An extended finite element method for dislocations in complex geometries: Thin films and nanotubes
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
نرم افزارهای علوم کامپیوتر
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: An extended finite element method for dislocations in complex geometries: Thin films and nanotubes An extended finite element method for dislocations in complex geometries: Thin films and nanotubes](/preview/png/499083.png)
چکیده انگلیسی
Dislocation models based on the extended finite element method (XFEM) are developed for thin shells such as carbon nanotubes (CNTs) and thin films. In shells, methods for edge dislocations, which move by glide, and prismatic dislocations, which move by climb, are described. In thin films, methods for dislocations with edge, screw and/or prismatic character are developed in three dimensions. Singular enrichments are proposed which allow the Peach–Koehler force to be computed directly from the stress field along the dislocation line and give improved accuracy.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Computer Methods in Applied Mechanics and Engineering - Volume 198, Issues 21–26, 1 May 2009, Pages 1872–1886
Journal: Computer Methods in Applied Mechanics and Engineering - Volume 198, Issues 21–26, 1 May 2009, Pages 1872–1886
نویسندگان
Jay Oswald, Robert Gracie, Roopam Khare, Ted Belytschko,