Use of the multilayer perceptron to analog fault functional test creation

This paper discusses the utilization of Multi Layer Perceptron (MLP)to analog fault detection, The functional test is proposed due to practical utilization. The system can effectively detect a single catastrophic fault as well as parametric ones. The first obtained and presented result are promising and tend to prove that the proposed strategy can improve fault detection rate. The pressure is put on combination between MLP and fault detection in AC domain. The paper discusses the creation of AC domain MLP Test. It also takes into account time consumption. Presented method belongs to SBT Techniques.