کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5015726 | 1464474 | 2017 | 12 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Analysis of grit interference mechanisms for the double scratching of monocrystalline silicon carbide by coupling the FEM and SPH
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی صنعتی و تولید
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چکیده انگلیسی
Three-dimensional twice scratching and double scratching of monocrystalline silicon carbide with two cone-shaped grains were simulated by coupling the finite element (FEM) and smoothed particle hydrodynamics (SPH) to resolve the mesh distortion problem caused by using the FEM. Twice-scratching experiments were performed under three different conditions to validate the coupled finite element (FE) and SPH model in the scratching simulation with two diamond grits. The experimental results were compared to the simulation results. For twice scratching, the simulation results conform with the experimental results, indicating the validity of the coupled FE and SPH model. Thus, the coupled FE and SPH model was used to simulate the double-scratching process under different conditions. The results of the double-scratching simulation showed that the interference damages in the scratching process occurred under three circumstances: the interference of lateral cracks, the interference of lateral cracks and plastic damage, and the interference of plastic damage. The influence of distance on the interference damage of the two diamond grits in the Y-direction was analysed. The changes in the maximum depth and width in the interference region and the scratching force with the distance of the two grains in the Y-direction are illustrated.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: International Journal of Machine Tools and Manufacture - Volume 120, September 2017, Pages 49-60
Journal: International Journal of Machine Tools and Manufacture - Volume 120, September 2017, Pages 49-60
نویسندگان
Nian Duan, Yiqing Yu, Wenshan Wang, Xipeng Xu,