کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
514005 | 866686 | 2012 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electromechanical analysis of micro-beams based on planar finite-deformation theory
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
نرم افزارهای علوم کامپیوتر
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
In MEMS devices, solids, often slender in geometry, are in nonlinear interaction with complex three-dimensional electrostatic fields. The computational cost of solving these coupled problems can be reduced considerably by the use of structural models. A geometrically exact planar beam model is used for the solid, with particular attention to normal tractions on the interface that arise from electrostatic pressure distribution. The weakly coupled problem is solved with a staggered strategy. The resulting scheme provides accuracy comparable to that obtained by full, three-dimensional representations of the solid, at costs that may be reduced significantly.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Finite Elements in Analysis and Design - Volume 49, Issue 1, February 2012, Pages 28–34
Journal: Finite Elements in Analysis and Design - Volume 49, Issue 1, February 2012, Pages 28–34
نویسندگان
Igor Sokolov, Slava Krylov, Isaac Harari,