کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
533219 870077 2016 11 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Multiple instance subspace learning via partial random projection tree for local reflection symmetry in natural images
ترجمه فارسی عنوان
فراخوانی زیرمجموعه نمونه چندگانه با استفاده از درخت طرحریزی تصادفی برای تقارن انعکاسی محلی در تصاویر طبیعی
کلمات کلیدی
تشخیص متقارن، یادگیری یکپارچه چند نمونه درختی تصادفی تصادفی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر چشم انداز کامپیوتر و تشخیص الگو
چکیده انگلیسی


• We perform clustering on samples represented by multiple instances.
• We learn a group of MIL classifiers on subspaces.
• We report state-of-the-arts results on the symmetry detection benchmark.

Local reflection symmetry detection in nature images is a quite important but challenging task in computer vision. The main obstacle is both the scales and the orientations of symmetric structure are unknown. The multiple instance learning (MIL) framework sheds lights onto this task owing to its capability to well accommodate the unknown scales and orientations of the symmetric structures. However, to differentiate symmetry vs non-symmetry remains to face extreme confusions caused by clutters scenes and ambiguous object structures. In this paper, we propose a novel multiple instance learning framework for local reflection symmetry detection, named multiple instance subspace learning (MISL), which instead learns a group of models respectively on well partitioned subspaces. To obtain such subspaces, we propose an efficient dividing strategy under MIL setting, named partial random projection tree (PRPT), by taking advantage of the fact that each sample (bag) is represented by the proposed symmetry features computed at specific scale and orientation combinations (instances). Encouraging experimental results on two datasets demonstrate that the proposed local reflection symmetry detection method outperforms current state-of-the-arts.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Pattern Recognition - Volume 52, April 2016, Pages 306–316
نویسندگان
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