Characterization of x-ray imaging crystal spectrometer for high-resolution spatially-resolved x-ray Thomson scattering measurements in shock-compressed experiments

• A dual-channel x-ray crystal spectrometer for XRTS measurements was developed.
• The capabilities of high spectral and spatial resolution were characterized.
• Back scattered spectra from warm dense carbon samples using XFEL was collected.
• Spatial profiles of elastic peaks were compared with spatial-resolved spectra.

We have proposed, designed and built a dual-channel x-ray imaging crystal spectrometer (XICS) for spectrally- and spatially-resolved x-ray Thomson scattering (XRTS) measurements in the Matter in Extreme Conditions (MEC) end station at the Linac Coherent Light Source (LCLS). This spectrometer employs two spherically-bent germanium (Ge) 220 crystals, which are combined to form a large aperture dispersive element with a spectral bandwidth of ~300 eV that enables both the elastic and inelastic x-ray scattering peaks to be simultaneously measured. The apparatus and its characterization are described. A resolving power of ~1900 was demonstrated and a spatial resolution of ~12 μm was achieved in calibration tests. For XRTS measurements, a narrow-bandwidth (ΔE/E<0.003) LCLS x-ray free electron laser (XFEL) beam at 5.07 keV was used to probe a dense carbon plasma produced in shock-compressed samples of different forms of carbon. Preliminary results of the scattering experiments from Pyrolytic Graphite samples that illustrate the utility of the instrument are presented.