کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5427819 1508649 2015 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Hyperfine structure, lifetime and oscillator strength of V II
موضوعات مرتبط
مهندسی و علوم پایه شیمی طیف سنجی
پیش نمایش صفحه اول مقاله
Hyperfine structure, lifetime and oscillator strength of V II
چکیده انگلیسی


- New oscillator strength parameterisation method was successfully applied.
- Good agreement between ab initio and experimental values of radiative lifetimes.
- Radial integral of the main atomic transitions is determined for the first time.
- Oscillator strength values are calculated semi-empirically in a wide wavelength range: 2117-96,000 Å.

In first part of this work we confirm through data computed for the first time the well-founded basis of new experimental constant values for some V II levels, recently measured and published. Furthermore a good agreement is observed between single-step excitation and laser induced fluorescence V II radiative lifetimes found in the literature data and our computed values recurring to ab initio method. In the third part of this study we examined electric dipole transitions. We transformed angular coefficients of the transition matrix from SL coupling to intermediate one using fine structure eigenvector amplitudes, previously determined. Transition integrals, treated as free in the least squares fit to experimental oscillator strength (gf) values, were then extracted; we give the two main deduced values: 〈3d34p|r1|3d34s〉=−3.0346±0.0094 and 〈3d34p|r1|3d4〉=0.8278±0.0026. This procedure, which provides accurate evaluations, differs totally with previous ways using for instance the Thomas-Fermi-Dirac method to compute transition integral values. Finally, for a complete list of permitted transitions from depopulated odd-parity levels, gf values are calculated semi-empirically in a wide wavelength range: 2110-96,000 Å

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Quantitative Spectroscopy and Radiative Transfer - Volume 166, November 2015, Pages 55-63
نویسندگان
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