کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5427912 1508653 2015 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Using linear polarization to monitor nanoparticle purity
ترجمه فارسی عنوان
با استفاده از قطبش خطی برای نظارت بر خلوص نانو ذرات
موضوعات مرتبط
مهندسی و علوم پایه شیمی طیف سنجی
چکیده انگلیسی


- We study the effect of contamination on nanoparticle resonances.
- We compare linear polarization with extinction as a measurement tool.
- Contamination weakens the resonances and changes the Kerker conditions.

We study the effect of contaminants on the resonances of silicon nanoparticles (NPs) by considering the spectral evolution of the degree of linear polarization of light scattered at right angles to the incident beam, PL(90°). From an optical point of view, a decrease in the purity of silicon nanoparticles due to the presence of contaminants impacts the NP effective refractive index. We analyze this effect for a silicon nanosphere (R=200 nm) suspended in different media. We focus on the spectral range where the quadrupolar magnetic, dipolar electric and dipolar magnetic resonances appear. The weakness of the resonances induced on the PL(90°) spectrum by the lack of purity can be used to quantify the contamination of the material. In addition, it is shown that Kerker conditions also suffer from a spectral shift, that is quantified as a function of material purity.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Quantitative Spectroscopy and Radiative Transfer - Volume 162, September 2015, Pages 190-196
نویسندگان
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