Development of a Mueller matrix imaging system for detecting objects embedded in turbid media

- This work characterizes the polarimetric behavior of highly depolarizing systems.
- Imaging polarimetry was used to obtain Mueller matrices of turbid media.
- Experimental matrices of turbid media are well reproduced by Monte Carlo simulations.
- A new relative matrix detects the nature of an object embedded in a turbid medium.

In this research, the Mueller matrix (MM) imaging polarimetry technique is used to experimentally measure the MMs corresponding to the surface reflectance of turbid media in which an opaque object is immersed. Depending on the penetration depth of light in the medium and the location of the object, the MM may be sensitive enough as to detect not only its presence and location but also its characteristics, according to the nature of its interaction with the incident light. A Dual Rotating Compensator Polarimeter (DRCP) has been used to obtain accurate surface MMs for either reflecting or absorbent objects. It is shown how the comparison of the experimental MMs and the corresponding object-free MMs can be made by means of a relative matrix. The results show how this new tool may assess the enhanced contrast that this technique provides.