کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5429358 | 1397347 | 2012 | 6 صفحه PDF | دانلود رایگان |
Electron impact widths of eight Si IV spectral lines have been calculated using our quantum mechanical method. Semiclassical perturbation calculations using atomic data from the SUPERSTRUCTURE code have been also performed. Comparison with recent measurements shows that they are always lower than our quantum mechanical, semiclassical perturbation and all other theoretical results. A disagreement in the importance of fine structure effects between our results and the measured ones has been reported here.
⺠We perform new quantum mechanical calculations for the Si IV line widths. ⺠We compare our results with the most recent experimental ones. ⺠We discuss the importance of fine structure effects on the line widths. ⺠The importance of these effects in our work disagrees with measurements.
Journal: Journal of Quantitative Spectroscopy and Radiative Transfer - Volume 113, Issue 12, August 2012, Pages 1606-1611