Comparison of T-matrix method with discrete sources method applied for total internal reflection microscopy

In the paper we applied a variant of the T-matrix method, the null-field method with discrete sources (NFM-DS) and the discrete sources method (DSM) to model light scattering by a particle near a plane surface in an evanescent wave field. Such investigations have a great practical value for total internal reflection microscopy (TIRM). The numerical algorithms of DSM and NFM-DS have been modified to model the specific conditions of real measurement experiments carried out in Stuttgart University. Objective response and scattering cross-section have been calculated. Numerical results of both methods have been compared and demonstrate good agreement with measurements.