Light scattering on random dielectric layers

Scattering of light by a random stack of dielectric layers represents a one-dimensional scattering problem, where the scattered field is a three-dimensional vector field. We investigate the dependence of the scattering properties (band gaps and Anderson localization) on the wavelength, strength of randomness and relative angle of the incident wave. There is a characteristic angular dependence of Anderson localization for wavelengths close to the thickness of the layers. In particular, the localization length varies non-monotonously with the angle. In contrast to Anderson localization, absorptive layers do not have this characteristic angular dependence.