High coercivity Sm-Co thin films from elemental Sm/Co multilayer deposition and their microstructural aspects

Hard magnetic thin films with high coercivity were fabricated by magnetron sputtering on MgO(100) and quartz substrates. The films were grown by depositing sequentially Sm and Co layers at an elevated substrate temperature of 500 °C. Subsequent post-annealing was carried out at various temperatures in range of 500-700 °C to form Sm-Co hard magnetic thin films. X-ray diffraction studies revealed the formation of randomly oriented SmCo5 crystallites on quartz substrate, whereas, a textured growth of Sm2Co7 with strong (110) crystalline phases was observed on MgO substrate. Microstructural analyses were carried out using Transmission Electron Microscopy (TEM) for samples grown on MgO substrate at 650 °C and inferred the presence of high density planar defects along with large grain boundaries. Further microdiffraction studies confirmed the presence of SmCo3 as an impurity phase in the films. Magnetic hysteresis measurements indicate the square hysteresis behaviors with high coercivity value of 3.1 T and 2.7 T for 650 °C annealed samples on both MgO and quartz substrates, respectively. The origin of such high coercivity value was then correlated with pinning type of spin reversal mechanism as confirmed through the analyses of demagnetization curves. The magnetic force microscopy images for films on MgO substrate, annealed at 650 °C, revealed the presence of magnetic domains with size higher than 1 µm. The formed magnetic domains lacked well defined boundaries indicating an enhanced exchange coupling between the grain clusters.