کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
609816 880631 2010 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Hysteresis during contact angles measurement
موضوعات مرتبط
مهندسی و علوم پایه مهندسی شیمی شیمی کلوئیدی و سطحی
پیش نمایش صفحه اول مقاله
Hysteresis during contact angles measurement
چکیده انگلیسی

A theory, based on the presence of an adsorbed film in the vicinity of the triple contact line, provides a molecular interpretation of intrinsic hysteresis during the measurement of static contact angles. Static contact angles are measured by placing a sessile drop on top of a flat solid surface. If the solid surface has not been previously in contact with a vapor phase saturated with the molecules of the liquid phase, the solid surface is free of adsorbed liquid molecules. In the absence of an adsorbed film, molecular forces configure an advancing contact angle larger than the static contact angle. After some time, due to an evaporation/adsorption process, the interface of the drop coexists with an adsorbed film of liquid molecules as part of the equilibrium configuration, denoted as the static contact angle. This equilibrium configuration is metastable because the droplet has a larger vapor pressure than the surrounding flat film. As the drop evaporates, the vapor/liquid interface contracts and the apparent contact line moves towards the center of the drop. During this process, the film left behind is thicker than the adsorbed film and molecular attraction results in a receding contact angle, smaller than the equilibrium contact angle.

When a drop is first placed on top of a solid surface, there is no adsorbed film in contact with the vapor/liquid interface. By a process of evaporation/adsorption, an adsorbed film grows and modifies the mechanical equilibrium and the apparent contact angle.Figure optionsDownload high-quality image (24 K)Download as PowerPoint slide

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Colloid and Interface Science - Volume 343, Issue 2, 15 March 2010, Pages 574–583
نویسندگان
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