SECM detection of single boron doped diamond nanodes and nanoelectrode arrays using phase-operated shear force technique

► For the first time, BDD nanoelectrode arrays were studied using SECM measurements. ► A nano-sized electrode (r = 167 nm) was employed as a SECM tip. ► A phase-based shear force regulated SECM provides a constant distance of ~ 45 nm. ► A lateral resolution within a 100 nm range was successfully achieved. ► 320 nm BDD nanodes and their arrangement in a NCD surface were clearly detected.