کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
6885376 | 1444510 | 2018 | 14 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Reliability over consecutive releases of a semiconductor Optical Endpoint Detection software system developed in a small company
ترجمه فارسی عنوان
قابلیت اطمینان در نسخه های متوالی یک سیستم نرم افزاری تشخیص نهایی نوری نیمه هادی فراهم شده در یک شرکت کوچک توسعه یافته است
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کلمات کلیدی
قابلیت اطمینان، نرم افزار نیمه هادی، آزمایش کردن، تجزیه و تحلیل نقص ها، نسخه های نرم افزاری و انتشار،
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
شبکه های کامپیوتری و ارتباطات
چکیده انگلیسی
Demonstrating software reliability across multiple software releases has become essential in making informed decisions of upgrading software releases without impacting significantly end users' characterized processes and software quality standards. Standard defect and workload data normally collected in a typical small software development organization can be used for this purpose. Most of these organizations are normally under aggressive schedules with limited resources and data availability that are significantly different from large commercial software organizations where software reliability engineering has been successfully applied. Trend test, input domain reliability models (IDRM), and software reliability growth models (SRGM) were used in this paper on a semiconductor Optical Endpoint Detection (OED) software system to examine its overall trend and stability, to assess the system's operational reliability, and to track its reliability growth over multiple releases. These techniques also provided evidence that continuous defect fixes increased software reliability substantially over time for this software system.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Systems and Software - Volume 137, March 2018, Pages 355-365
Journal: Journal of Systems and Software - Volume 137, March 2018, Pages 355-365
نویسندگان
Eric Abuta, Jeff Tian,