Ultra-low voltage and energy efficient adders in 28Â nm FDSOI exploring poly-biasing for device sizing

Balancing the PMOS/NMOS strength ratio is a key issue to maximize the noise margin, and hence, the functional yield of CMOS logic gates and minimize the leakage energy per cycle in the subthreshold region. In this work, the PMOS/NMOS strength ratio was balanced using a poly-biasing technique in conjunction with back-gate biasing provided in a 28 nm fully depleted silicon on insulator (FDSOI) CMOS technology. A 32-bit adder based on minority-3 (min-3) gates and a 16-bit adder based on Boolean gates have been implemented. Chip measurement results of nine samples show highly energy efficient adders. The 32-bit and 16-bit adders achieved mean minimum energy points (MEP) of 20.8 fJ at 300 mV and 12.34 fJ at 250 mV, respectively. In comparison to adders reported in other works in the same technology, the energy per 1-bit addition of the 32-bit adder is improved by 37%. This improvement in energy consumption is 25% for the 16-bit adder. According to the measurement results of ten chips, the designed adders exhibited functionality down to supply voltages of 110 mV-125 mV, without body biasing. Additionally, the minimum Vdd of all the 32-bit adders based on minority-3 gates decreased to 80 mV by applying a reverse back bias voltage to the PMOS devices. One sample was functional at 79 mV with a 430 mV reverse back bias voltage applied to its PMOS devices.