Single-frame digital phase-shifting 3D shape measurement using pixel-wise moiré-wavelength refinement

A novel pixel-wise moiré-wavelength refinement technique was developed for system calibration in single-frame digital phase-shifting 3D shape measurement. The method requires projection of only a single binary grid and capture of a single image frame. Phase-shifted images are generated by digitally phase-shifting a synthetic grid superimposed on the captured frame. The grid patterns are removed from the generated images by wavelet-Fourier transform to extract moiré patterns, from which phase and surface height are computed. A wavelength-height function, computed during system calibration, accounts for moiré-wavelength variation over calibration depth in phase-to-height mapping. Novel pixel-wise wavelength and height (depth) refinement, using this function, improved measurement accuracy compared to measurement using a single global wavelength across all pixels. The method was demonstrated in measurement of a flat plate, hemispherical object, and manikin head.