کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7133100 | 1461741 | 2014 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Investigation of the ablation of fluorine-doped tin oxide thin films by square top-hat ultraviolet laser beams
ترجمه فارسی عنوان
بررسی تخلیه فیلم های نازک اکسید تیتانیوم فلوراید با استفاده از پرتوهای لیزر ماوراء بنفش
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کلمات کلیدی
اکسید قلع گداخته فلوراید، لیزر اشعه ماوراء بنفش پرتو پرچم مربع، الگوی الکترود، خواص هدایت،
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی برق و الکترونیک
چکیده انگلیسی
This paper presents a square top-hat beam shaper in an ultraviolet (UV) laser processing system for electrode patterning and investigates the interaction between square laser beams and fluorine-doped tin oxide (FTO) thin films deposited on glass substrates. The various patterning parameters to ablate the FTO films used in this experiment are included laser fluences, pulse repetition frequencies, and feeding rates of a motorized platform. The laser pulse repetition frequency and the feeding rate of the motorized platform were used to calculate the overlapping rate of laser spot and to determine the patterning quality. The line width and depth, edge quality, three-dimensional topography, and electrical conductivity properties of the patterned FTO films were measured and analyzed using a confocal laser scanning microscope and a four-point probe instrument. Experimental results indicated that the ablated line width and depth increased with increasing laser fluence. After electrode patterning with laser fluence of 2.07 J/cm2 and 80% overlapping rate, no damages were observed in the patterned lines on the glass substrate. Moreover, the patterned line paths were narrow, smooth, clear, and flat in response to uniform laser energy distribution interacted in FTO films. The measured values of sheet resistance ranged from 109.7±3.8 Ω/⡠to 139.3±4.9 Ω/⡠at 2.07 J/cm2 to 9.37 J/cm2 laser fluences, respectively. The proposed process can reduce the fabrication steps and improve the removal efficiency of transparent conductive oxide materials and no waste etching chemical solution is produced.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics and Lasers in Engineering - Volume 52, January 2014, Pages 212-217
Journal: Optics and Lasers in Engineering - Volume 52, January 2014, Pages 212-217
نویسندگان
Shih-Feng Tseng, Wen-Tse Hsiao, Donyau Chiang, Chien-Kai Chung, Jer-Liang Andrew Yeh,